Rudolph Technologies, inc. (NASDAQ: RTEC), a worldwide leader in process characterization solutions for the semiconductor manufacturing industry, announced today that seven NSX® Series inspection tools were recently installed at WIN Semiconductors, the world’s leading foundry that serves the global wireless information and networking markets. Following a competitive evaluation, WIN also acquired multiple licenses for Rudolph’s Discover™ defect analysis/yield management software.

        Based in Taiwan, WIN is the largest pure play gallium arsenide (GaAs) foundry in the world, specializing in the manufacture of radio frequency integrated circuits for cell phones and other communications applications. WIN’s purchase was driven by the NSX 105 system’s proven capability to deliver high-volume throughput while maintaining the sensitivity to identify defects as small as one micron.

        In looking at this customer’s specific needs, Rudolph recommended a combined defect analysis/wafer-level signature recognition software package for 24/7 process monitoring. This data management system will help WIN to quickly and easily trace patterns back to yield-killing process issues.

        “We are truly gratified by WIN’s selection of the NSX and the commitment they have demonstrated by their NSX orders over the course of the past year,” said Mayson Brooks, Rudolph’s vice president of sales. “As the leading GaAs manufacturer, they have helped us understand and respond to the specific needs of this rapidly-growing market segment. We look forward to continuing to serve those needs as they execute their plans for further expansion in the coming year.”

        “The information provided by the NSX has been critical in our efforts to meet our customers’ requirements for fast delivery and high quality,” commented Chin-chi Chang, Ph.